Solutions · Semiconductors

Characterise silicon across every corner

New silicon has to be characterised across supply, load, frequency and temperature. m8rix plans the sweeps, runs them on your bench and computes the metrics from the raw samples.

What you can validate

m8rix for semiconductors

  • Power-management ICsRegulation, efficiency, transient response and protection across the operating range.
  • Supply and corner sweepsVDD and load corners with a measurement at every point, within your limits.
  • Evaluation-board bring-upFirst power-on with current limits set from the datasheet, then a structured bring-up.
  • Datasheet tablesEach parameter measured and tabulated against its min, typical and max.
01Plan the corners02Sweep and capture03Datasheet table

Workflows

Say what to test. It runs the rest.

Each workflow starts with a sentence. The agent turns it into a plan you review, then runs it on your bench.

01

PMIC characterisation

Line and load regulation, efficiency and ripple across input voltage and load.

> Characterise the buck regulator across 3 to 5.5 V input and 0 to 3 A load.

02

Corner sweep

VDD at its corners, measure current and maximum frequency at each.

> Sweep VDD from 0.9 to 1.3 V and measure IDD at each step.

03

Evaluation-board first power-on

Current limits from the datasheet, rails brought up one by one, each checked before the next.

> Bring up the eval board safely with the datasheet limits.

Why m8rix

Built for hardware that has to work

Limits it cannot cross

Your device's ratings are hard limits, checked on every step by deterministic code. The AI can't loosen them.

Every run on the record

Every command, who asked for it and the result, with the data and waveforms kept for review.

Metrics from the raw samples

Waveforms are captured and the numbers computed from the samples, not read off the screen.

On this bench

  • Source meters47
  • Power supplies335
  • Electronic loads11
  • Oscilloscopes171
  • Signal generators97
  • and anything else with SCPI